Device and materials characterization can be challenging, especially when dealing with low-level source and measurement values. This is particularly the case when characterizing low-resistance/superconductive samples, high-resistance materials, and samples with large differences in states, like topological insulating materials.

This webinar will introduce practical steps that can ensure high-quality and repeatable measurements.

Topics will include:

• Proper wiring, guarding, and shielding
• Similarities and differences between AC/lock-in and DC measurement techniques
• Filtering and its effects on data
• Key factors for successful measurements at cryogenic temperatures
• Single-ended vs. differential measurements

Jason Chonko is a business development manager with Lake Shore Cryotronics. A 1998 graduate of Kent State University with a BSci in physics, he started his career as a lab technician at the university’s Liquid Crystal Institute, then worked at several optical startups as a staff engineer dealing with the challenges of research and design. Most of his 25-plus years in the industry have been spent as an Applications Engineer and marketer for several general-purpose test and measurement companies, with the goal of always helping customers get the most out of their instrumentation. With Lake Shore, he specializes in electrical device characterization systems, often performing technical analysis of customer applications to aid in product selection.

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• Source: https://physicsworld.com/a/lower-noise-better-data-a-guide-to-reliable-device-characterization/